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  • Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS [2010]

    Category:
    Artículos
    Authors:
    Agnès Tempez , Nerea Bordel García , José Ignacio Martín Carbajo , Jorge Pisonero Castro , Alfredo Sanz Medel , Carlos Quirós Fernández , Rebeca Valledor González
    Date:
    01 of January of 2010
    It Is a Part of:
    Analytical and Bioanalytical Chemistry